Open AccessMorphological analysis of optocoupler accelerated degradation test data
Author(s) -
Xuangong Zhang,
Xiyan Mu,
Huizhi Li
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1187/2/022022
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , missile , mechanism (biology) , key (lock) , consistency (knowledge bases) , degradation (telecommunications) , test data , failure mechanism , data consistency , experimental data , engineering , artificial intelligence , distributed computing , structural engineering , mathematics , computer security , telecommunications , power (physics) , philosophy , physics , epistemology , quantum mechanics , programming language , aerospace engineering , statistics