Open AccessInvestigation of resistive switching in SiO2 layers with Si nanocrystals
Author(s) -
E. Manolov,
Judith M. Paz-Delgadillo,
V. Dzhurkov,
N. Nedev,
D. Nesheva,
Mario Curiel,
Benjamín Valdéz-Salas
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1186/1/012022
Subject(s) - materials science , annealing (glass) , nanocrystal , transmission electron microscopy , optoelectronics , capacitance , dielectric , electrical conductor , silicon , insulator (electricity) , nanotechnology , analytical chemistry (journal) , electrode , composite material , chemistry , chromatography