Open AccessIntegration density of ion-damaged barrier Josephson junction and circuits
Author(s) -
Denis Crété,
Yves Lemaı̂tre,
Juan Trastoy,
B. Marcilhac,
C. Ulysse
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1182/1/012002
Subject(s) - josephson effect , pi josephson junction , electronic circuit , superconductivity , footprint , limit (mathematics) , amplitude , optoelectronics , superconducting tunnel junction , integrated circuit , electrical engineering , materials science , condensed matter physics , physics , engineering , optics , paleontology , mathematical analysis , mathematics , biology