Open AccessResearch on Software Failure Modes and Key Testing Methods of the Smart Meter
Author(s) -
Fukuan Pang,
Wenwu Cui,
Chen Wang,
Di Han,
Yi Pan,
Wang Pingping
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1168/2/022026
Subject(s) - software reliability testing , smart meter , reliability engineering , software , regression testing , computer science , software performance testing , non regression testing , software quality , key (lock) , white box testing , reliability (semiconductor) , embedded system , engineering , software construction , software system , software development , electricity , operating system , electrical engineering , power (physics) , physics , quantum mechanics