Open AccessComparation of X-ray diffraction pattern refinement using Rietica and MAUD of ZnO nanoparticles and nanorods
Author(s) -
Sri Yani Purwaningsih,
Nur Laili Alfina Rosidah,
Mochamad Zainuri,
T. Triwikantoro,
Suminar Pratapa,
D. Darminto
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1153/1/012070
Subject(s) - crystallite , nanorod , diffraction , materials science , scanning electron microscope , rietveld refinement , nanoparticle , powder diffraction , x ray crystallography , analytical chemistry (journal) , precipitation , gaussian , orientation (vector space) , crystallography , optics , nanotechnology , mathematics , composite material , chemistry , physics , chromatography , geometry , metallurgy , meteorology , computational chemistry