Open AccessUse of Langmuir probe for analysis of charged particles in metal vapour generated by electron beam heating
Author(s) -
Biswaranjan Dikshit,
M. S. Bhatia
Publication year - 2008
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/114/1/012030
Subject(s) - langmuir probe , electron temperature , ionization , plasma , atomic physics , chemistry , thermal ionization , electron , evaporation , electron ionization , plasma diagnostics , ion , physics , organic chemistry , quantum mechanics , thermodynamics