Open AccessVery thin films: influence of the reflectance and transmittance uncertainties on the estimation of the films optical parameters
Author(s) -
P. Gushterova,
P. Sharlandjiev,
Boian A. Hristov
Publication year - 2008
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/113/1/012019
Subject(s) - transmittance , reflectivity , dispersion (optics) , optics , permittivity , wavelength , materials science , thin film , random error , computational physics , mathematics , physics , analytical chemistry (journal) , chemistry , statistics , optoelectronics , dielectric , nanotechnology , chromatography