Open AccessRecrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope
Author(s) -
V. Yu. Kolosov,
A. A. Yushkov,
L. M. Veretennikov
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1115/3/032087
Subject(s) - electron beam induced deposition , materials science , transmission electron microscopy , bismuth , scanning electron microscope , amorphous solid , crystallite , thin film , microstructure , conventional transmission electron microscope , scanning transmission electron microscopy , optics , recrystallization (geology) , electron microscope , crystallography , composite material , nanotechnology , chemistry , metallurgy , paleontology , physics , biology