Open AccessModeling the process of fitting thick-film resistors by the method of flare discharge
Author(s) -
Михаил Николаевич Пиганов,
D N Novomeyeisky
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1096/1/012183
Subject(s) - resistor , process (computing) , curve fitting , materials science , electronic circuit , substrate (aquarium) , electronic engineering , computer science , electrical engineering , engineering , voltage , geology , oceanography , machine learning , operating system