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Determination of test cycle sensitivity coefficients for the Rockwell HR45N hardness scale
Author(s) -
Renato Reis Machado,
S Low
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1065/6/062008
Subject(s) - rockwell scale , nist , sensitivity (control systems) , scale (ratio) , work (physics) , materials science , engineering , computer science , mechanical engineering , metallurgy , physics , electronic engineering , quantum mechanics , natural language processing

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