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The Emerging Field of Quantum Based Measurements for Pressure, Vacuum and Beyond
Author(s) -
James Hendricks,
Zeeshan Ahmed,
Daniel S. Barker,
Patrick F. Egan,
Kevin O. Douglass,
Stephen Eckel,
James A. Fedchak,
Nikolai N. Klimov,
Jacob E. Ricker,
Julia Scherschligt,
Jack A. Stone
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1065/16/162017
Subject(s) - nist , quantum metrology , metrology , quantum sensor , quantum optics , photonics , photon , pressure measurement , atom (system on chip) , spectroscopy , materials science , quantum technology , laser , field (mathematics) , radiation pressure , quantum , ultra high vacuum , atomic physics , optics , physics , optoelectronics , nanotechnology , quantum mechanics , open quantum system , thermodynamics , mathematics , natural language processing , computer science , pure mathematics , embedded system

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