Open AccessHigh precision (Advanced) angle metrology: pushing the limits for nanoradian uncertainty demands
Author(s) -
Tanfer Yandayan
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1065/14/142002
Subject(s) - metrology , computer science , measurement uncertainty , dimensional metrology , systems engineering , optics , engineering , physics , quantum mechanics