Open AccessDiagnostic of semiconductor device structures by spin-labeled electrons
Author(s) -
R. I. Dzhioev,
M. Kotur,
Н. К. Полетаев
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1038/1/012087
Subject(s) - electron , semiconductor , excitation , condensed matter physics , range (aeronautics) , spin (aerodynamics) , diffusion , materials science , electron mobility , recombination , atomic physics , free electron model , physics , chemistry , optoelectronics , biochemistry , quantum mechanics , gene , composite material , thermodynamics