Open AccessPhotoemission studies of the interface formation of ultrathin MgO dielectric layers on the oxidised Si(111) surface
Author(s) -
Barry Brennan,
Stephen McDonnell,
Greg Hughes
Publication year - 2008
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/100/4/042047
Subject(s) - x ray photoelectron spectroscopy , materials science , analytical chemistry (journal) , band gap , silicon , binding energy , band bending , oxide , dielectric , thin film , band offset , valence (chemistry) , fermi level , photoemission spectroscopy , optoelectronics , nanotechnology , electron , chemistry , nuclear magnetic resonance , atomic physics , metallurgy , valence band , physics , organic chemistry , chromatography , quantum mechanics