Open AccessNon-destructive compositional depth profile analysis by hard x-ray photoelectron spectroscopy
Author(s) -
J. Rubio-Zuazo,
G.R. Castro
Publication year - 2008
Publication title -
journal of physics. conference series
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/100/1/012042
Subject(s) - x ray photoelectron spectroscopy , materials science , spectroscopy , analytical chemistry (journal) , physics , nuclear magnetic resonance , chemistry , environmental chemistry , astronomy