Open AccessScaling limits and reliability of SOI CMOS technology
Author(s) -
Dimitris E. Ioannou
Publication year - 2005
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/10/1/001
Subject(s) - silicon on insulator , cmos , scaling , reliability (semiconductor) , limit (mathematics) , scalability , transistor , electronic engineering , materials science , optoelectronics , computer science , electrical engineering , engineering , physics , silicon , mathematics , voltage , quantum mechanics , mathematical analysis , power (physics) , geometry , database