Open AccessEstablishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths
Author(s) -
N M Ridler,
Susan Johny,
Martin Salter,
Xiaobang Shang,
Wenjuan Sun,
Alan C. Wilson
Publication year - 2021
Publication title -
metrologia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.637
H-Index - 79
eISSN - 1681-7575
pISSN - 0026-1394
DOI - 10.1088/1681-7575/abd371
Subject(s) - traceability , waveguide , calibration , optics , wavelength , materials science , scattering , scattering parameters , metrology , primary standard , aperture (computer memory) , quality (philosophy) , optoelectronics , physics , computer science , acoustics , software engineering , quantum mechanics
This paper presents a detailed assessment of two rectangular metallic waveguide lines in order that they can be used as primary standards to provide metrological traceability for electrical scattering parameter measurements at submillimetre wavelengths. The assessment comprises a series of dimensional measurements to determine the overall quality of the lines in terms of the waveguide aperture size and alignment. This is followed by electrical measurements to confirm the electrical behaviour of the lines. Finally, the lines are employed as standards to calibrate a vector network analyser which is used to measure devices to verify the performance of the lines as calibration standards, in operando. The waveguide size is WM-380, which operates from 500 GHz to 750 GHz.