Open AccessRobustness of single-electron pumps at sub-ppm current accuracy level
Author(s) -
Friederike Stein,
H. Scherer,
Thomas Gerster,
R. Behr,
Martín Götz,
Eckart Pesel,
C. Leicht,
Niels Ubbelohde,
Thomas Weimann,
K. Pierz,
H. W. Schumacher,
Frank Hohls
Publication year - 2016
Publication title -
metrologia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.637
H-Index - 79
eISSN - 1681-7575
pISSN - 0026-1394
DOI - 10.1088/1681-7575/54/1/s1
Subject(s) - robustness (evolution) , accuracy and precision , electron , materials science , measurement uncertainty , current (fluid) , analytical chemistry (journal) , computer science , control theory (sociology) , physics , chemistry , statistics , mathematics , thermodynamics , chromatography , biochemistry , control (management) , artificial intelligence , gene , quantum mechanics