Open AccessCombination of in-situ ion beam analysis and thermal desorption spectroscopy for studying deuterium implanted in tungsten
Author(s) -
Karim-Alexandros Kantre,
Paul Stefan Szabo,
Marcos V. Moro,
C. Cupak,
R. Stadlmayr,
León Zendejas Medina,
F. Aumayr,
Daniel Primetzhofer
Publication year - 2021
Publication title -
physica scripta
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 83
eISSN - 1402-4896
pISSN - 0031-8949
DOI - 10.1088/1402-4896/ac1a88
Subject(s) - materials science , tungsten , deuterium , elastic recoil detection , desorption , outgassing , analytical chemistry (journal) , ion , thermal desorption , in situ , thermal desorption spectroscopy , annealing (glass) , spectroscopy , ion beam , atomic physics , thin film , chemistry , adsorption , nanotechnology , composite material , physics , quantum mechanics , metallurgy , organic chemistry , chromatography
We demonstrate a combinatorial approach integrating ion implantation followed by thermal annealing and simultaneous in situ ion beam analysis with thermal desorption spectroscopy in a single set-up. Atomic and molecular deuterium ions of 3 keV were implanted into bulk tungsten with doses exceeding 1 × 10 22 ions m −2 . Depth profiling of both, protium and deuterium was performed by elastic recoil detection analysis, while simultaneously the outgassing rates of molecular deuterium by thermal desorption spectroscopy were monitored during temperature ramps from room temperature to ≈1400 K. The combination of the two techniques in situ is shown capable to identify the distinct retention behavior of deuterium at different temperatures and in different reservoirs, e.g. located close to the surface and diffused deep into the material. Ex-situ scanning electron microscopy confirmed blister formation, and recovery of the initial surface morphology after high temperature annealing, in analogy to comprehensive ex-situ studies.