Open AccessHigh-precision atomic force microscopy with atomically-characterized tips
Author(s) -
Alexander Liebig,
Angelo Peronio,
Daniel Meuer,
Alfred J. Weymouth,
Franz J. Gießibl
Publication year - 2020
Publication title -
new journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.584
H-Index - 190
ISSN - 1367-2630
DOI - 10.1088/1367-2630/ab8efd
Subject(s) - physics , atomic force microscopy , atomic units , sample (material) , conductive atomic force microscopy , kelvin probe force microscope , microscopy , electrostatic force microscope , chemical force microscopy , noise (video) , scale (ratio) , work (physics) , atomic force acoustic microscopy , surface (topology) , nanotechnology , optics , non contact atomic force microscopy , molecular physics , magnetic force microscope , materials science , geometry , magnetic field , magnetization , mathematics , quantum mechanics , artificial intelligence , computer science , image (mathematics) , thermodynamics
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip–sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimental data. Here, we employ AFM at relatively large tip–sample distances where forces are only on the piconewton and subpiconewton scale to prevent tip and sample distortions. Acquiring data relatively far from the surface requires low noise measurements. We probed the CaF 2 (111) surface with an atomically-characterized metal tip and show that the experimental data can be reproduced with an electrostatic model. By experimentally characterizing the second layer of tip atoms, we were able to reproduce the data with 99.5% accuracy. Our work links the capabilities of non-invasive imaging at large tip–sample distances and controlling the tip apex at the atomic scale.