
A general characterization method for nonlinearities in superconducting circuits
Author(s) -
Thomas Weißl,
Shan W. Jolin,
Riccardo Borgani,
Daniel Forchheimer,
David B. Haviland
Publication year - 2019
Publication title -
new journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.584
H-Index - 190
ISSN - 1367-2630
DOI - 10.1088/1367-2630/ab175a
Subject(s) - physics , intermodulation , microwave , nonlinear system , superconductivity , resonator , electronic circuit , characterization (materials science) , topology (electrical circuits) , optoelectronics , condensed matter physics , quantum mechanics , optics , electrical engineering , amplifier , engineering , cmos
Detailed knowledge of nonlinearity in superconducting microwave circuits is required for the optimal control of their quantum state. We present a general method to precisely characterize this nonlinearity to very high order. Our method is based on intermodulation spectroscopy at microwave frequencies and does not require DC-connection or DC-measurement of an on-chip reference structure. We give a theoretical derivation of the method and we validate it by reconstructing a known nonlinearity from simulated data. We experimentally demonstrate the reconstruction of the unknown nonlinear current-phase relation of a microwave resonator with superconducting nanowires.
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