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Quasi non-diffractive electron Bessel beams using direct phase masks with applications in electron microscopy
Author(s) -
Simon Hettler,
Lukas Grünewald,
Marek Malac
Publication year - 2019
Publication title -
new journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.584
H-Index - 190
ISSN - 1367-2630
DOI - 10.1088/1367-2630/ab03da
Subject(s) - physics , optics , electron , cathode ray , lens (geology) , bessel beam , phase (matter) , transmission electron microscopy , condenser (optics) , electron holography , beam (structure) , diffraction , electron microscope , electron tomography , scanning transmission electron microscopy , light source , quantum mechanics

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