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Characterization of external potential for field emission resonances and its applications on nanometer-scale measurements
Author(s) -
Shin-Ming Lu,
Wen-Yuan Chan,
Wei-Bin Su,
Woei Wu Pai,
HsiangLin Liu,
Chia-Seng Chang
Publication year - 2018
Publication title -
new journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.584
H-Index - 190
ISSN - 1367-2630
DOI - 10.1088/1367-2630/aab5c7
Subject(s) - physics , scanning tunneling microscope , quantum tunnelling , field (mathematics) , field electron emission , nanometre , plot (graphics) , molecular physics , characterization (materials science) , condensed matter physics , energy (signal processing) , potential energy , resonance (particle physics) , scale (ratio) , atomic physics , optics , quantum mechanics , pure mathematics , mathematics , statistics , electron

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