Open AccessMagnetic force microscopy with frequency-modulated capacitive tip–sample distance control
Author(s) -
Xue Zhao,
Johannes Schwenk,
Andrada-Oana Mandru,
Marcos Penedo,
Mirko Baćani,
Miguel A. Marioni,
H. J. Hug
Publication year - 2017
Publication title -
new journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.584
H-Index - 190
ISSN - 1367-2630
DOI - 10.1088/1367-2630/aa9ca9
Subject(s) - physics , cantilever , amplitude , optics , non contact atomic force microscopy , oscillation (cell signaling) , magnetic force microscope , atomic force acoustic microscopy , capacitive sensing , microscopy , magnetic field , kelvin probe force microscope , materials science , electrical engineering , magnetization , quantum mechanics , biology , composite material , genetics , engineering
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