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Looking behind the scenes: Raman spectroscopy of top-gated epitaxial graphene through the substrate
Author(s) -
Felix Fromm,
Peter Wehrfritz,
Martin Hundhausen,
Thomas Seyller
Publication year - 2013
Publication title -
new journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.584
H-Index - 190
ISSN - 1367-2630
DOI - 10.1088/1367-2630/15/11/113006
Subject(s) - graphene , raman spectroscopy , substrate (aquarium) , optoelectronics , graphene nanoribbons , silicon carbide , materials science , epitaxy , silicon , optics , physics , layer (electronics) , nanotechnology , composite material , oceanography , geology

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