Open AccessX-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of aluminium
Author(s) -
T. Walther,
John Nutter,
Johann Peter Reithmaier,
E.M. Pavelescu
Publication year - 2020
Publication title -
semiconductor science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.712
H-Index - 112
eISSN - 1361-6641
pISSN - 0268-1242
DOI - 10.1088/1361-6641/ab8c52
Subject(s) - superlattice , quantum dot , monolayer , transmission electron microscopy , epitaxy , molecular beam epitaxy , materials science , aluminium , optoelectronics , scanning electron microscope , resolution (logic) , scanning transmission electron microscopy , nanotechnology , layer (electronics) , composite material , artificial intelligence , computer science