Open AccessTransmission x-ray microscopy and its applications in battery material research—a short review
Author(s) -
Stephanie Spence,
Ivan Lee,
Feng Lin,
Xianghui Xiao
Publication year - 2021
Publication title -
nanotechnology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.926
H-Index - 203
eISSN - 1361-6528
pISSN - 0957-4484
DOI - 10.1088/1361-6528/ac17ff
Subject(s) - battery (electricity) , materials science , nanometre , instrumentation (computer programming) , transmission (telecommunications) , microscopy , nanotechnology , x ray , optics , computer science , telecommunications , physics , power (physics) , quantum mechanics , composite material , operating system
Transmission x-ray microscopy (TXM), which can provide morphological and chemical structural information inside of battery component materials at tens of nanometer scale, has become a powerful tool in battery research. This article presents a short review of the TXM, including its instrumentation, battery research applications, and the practical sample preparation and data analysis in the TXM applications. A brief discussion on the challenges and opportunities in the TXM applications is presented at the end.