Versatile technique for assessing thickness of 2D layered materials by XPS | Zendy

Dmitry Zemlyanov | Zendy; Michael L. Jespersen | Zendy; Dmitry N Zakharov | Zendy; Jianjun Hu | Zendy; Rajib Paul | Zendy; Anurag Kumar | Zendy; Shanèe Pacley | Zendy; Nicholas R. Glavin | Zendy; David Alberto Saenz | Zendy; Kyle C. Smith | Zendy; Timothy S. Fisher | Zendy; Andrey A. Voevodin | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Versatile technique for assessing thickness of 2D layered materials by XPS

Author(s) -

Dmitry Zemlyanov,

Michael L. Jespersen,

Dmitry N Zakharov,

Jianjun Hu,

Rajib Paul,

Anurag Kumar,

Shanèe Pacley,

Nicholas R. Glavin,

David Alberto Saenz,

Kyle C. Smith,

Timothy S. Fisher,

Andrey A. Voevodin

Publication year - 2018

Publication title -

nanotechnology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.926

H-Index - 203

eISSN - 1361-6528

pISSN - 0957-4484

DOI - 10.1088/1361-6528/aaa6ef

Subject(s) - x ray photoelectron spectroscopy , materials science , chemical vapor deposition , amorphous solid , characterization (materials science) , substrate (aquarium) , analytical chemistry (journal) , plasma enhanced chemical vapor deposition , thin film , boron nitride , optoelectronics , nanotechnology , chemical engineering , crystallography , chemistry , oceanography , chromatography , geology , engineering

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research