Ion-damage-free planarization or shallow angle sectioning of solar cells for mapping grain orientation and nanoscale photovoltaic properties
Author(s) -
Yasemin Kutes,
Justin Luria,
Yu Sun,
Andrew Moore,
Brandon Adrian Aguirre,
Jose Luis CruzCampa,
Mark Aindow,
David Zubía,
Bryan D. Huey
Publication year - 2017
Publication title -
nanotechnology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.926
H-Index - 203
eISSN - 1361-6528
pISSN - 0957-4484
DOI - 10.1088/1361-6528/aa67c2
Subject(s) - materials science , chemical mechanical planarization , electron backscatter diffraction , optoelectronics , crystallite , ion beam , focused ion beam , surface finish , optics , microstructure , ion , nanotechnology , composite material , polishing , beam (structure) , physics , quantum mechanics , metallurgy
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