
Correction of spherical surface measurements by confocal microscopy
Author(s) -
Jeremy Béguelin,
Toralf Scharf,
Wilfried Noell,
Reinhard Voelkel
Publication year - 2020
Publication title -
measurement science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.48
H-Index - 136
eISSN - 1361-6501
pISSN - 0957-0233
DOI - 10.1088/1361-6501/ab786b
Subject(s) - microscope , optics , optical microscope , materials science , numerical aperture , microscopy , wavefront , fabrication , depth of field , computer science , physics , wavelength , scanning electron microscope , medicine , alternative medicine , pathology