Two-probe STM experiments at the atomic level | Zendy

Marek Kolmer | Zendy; Piotr Olszowski | Zendy; Rafał Zuzak | Zendy; Szymon Godlewski | Zendy; Christian Joachim | Zendy; Marek Szymoński | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Two-probe STM experiments at the atomic level

Author(s) -

Marek Kolmer,

Piotr Olszowski,

Rafał Zuzak,

Szymon Godlewski,

Christian Joachim,

Marek Szymoński

Publication year - 2017

Publication title -

journal of physics condensed matter

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.908

H-Index - 228

eISSN - 1361-648X

pISSN - 0953-8984

DOI - 10.1088/1361-648x/aa8a05

Subject(s) - scanning tunneling microscope , scanning probe microscopy , dangling bond , atomic units , characterization (materials science) , planar , scanning capacitance microscopy , atom probe , scanning ion conductance microscopy , nanowire , nanotechnology , materials science , vibrational analysis with scanning probe microscopy , microscopy , optoelectronics , silicon , optics , scanning confocal electron microscopy , physics , computer graphics (images) , quantum mechanics , transmission electron microscopy , computer science

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research