Open AccessDetection of individual sub-pixel features in edge-illumination x-ray phase contrast imaging by means of the dark-field channel
Author(s) -
Norihito Matsunaga,
Kazuhiro Yano,
Marco Endrizzi,
Alessandro Olivo
Publication year - 2019
Publication title -
journal of physics. d, applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.857
H-Index - 198
eISSN - 1361-6463
pISSN - 0022-3727
DOI - 10.1088/1361-6463/ab5aa0
Subject(s) - contrast (vision) , pixel , optics , channel (broadcasting) , dark field microscopy , attenuation , sample (material) , physics , phase (matter) , image resolution , scattering , phase contrast imaging , enhanced data rates for gsm evolution , phase contrast microscopy , artificial intelligence , computer science , microscopy , telecommunications , quantum mechanics , thermodynamics
We report on a direct comparison in the detectability of individual sub-pixel-size features between the three complementary contrast channels provided by edge-illumination x-ray phase contrast imaging at constant exposure time and spatial sampling pitch. The dark-field (or ultra-small-angle x-ray scattering) image is known to provide information on sample micro-structure at length scales that are smaller than the system’s spatial resolution, averaged over its length. By using a custom-built groove sample, we show how this can also be exploited to detect individual, isolated features. While these are highlighted in the dark-field image, they remain invisible to the phase and attenuation contrast channels. Finally, we show images of a memory SD card as an indication towards potential applications.