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Characterization of functionalized glass and indium tin oxide surfaces as substrates for super-resolution microscopy
Author(s) -
Philip R. Nicovich,
Xun Lu,
Katharina Gaus,
J. Justin Gooding
Publication year - 2018
Publication title -
journal of physics d applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.857
H-Index - 198
eISSN - 1361-6463
pISSN - 0022-3727
DOI - 10.1088/1361-6463/aae7c3
Subject(s) - characterization (materials science) , indium tin oxide , microscopy , indium , tin , materials science , resolution (logic) , optical microscope , nanotechnology , oxide , chemistry , chemical engineering , metallurgy , optics , composite material , scanning electron microscope , thin film , physics , engineering , artificial intelligence , computer science

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