Exchange bias effects in Heusler alloy Ni2MnAl/Fe bilayers
Author(s) -
Tomoki Tsuchiya,
Takahide Kubota,
Tomoko Sugiyama,
Teodor Huminiuc,
Atsufumi Hirohata,
Kōki Takanashi
Publication year - 2016
Publication title -
journal of physics d applied physics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.857
H-Index - 198
eISSN - 1361-6463
pISSN - 0022-3727
DOI - 10.1088/0022-3727/49/23/235001
Subject(s) - materials science , antiferromagnetism , exchange bias , condensed matter physics , epitaxy , sputter deposition , magnetization , thin film , alloy , bilayer , electrical resistivity and conductivity , transmission electron microscopy , sputtering , analytical chemistry (journal) , magnetic field , nanotechnology , metallurgy , layer (electronics) , chemistry , magnetic anisotropy , quantum mechanics , biochemistry , engineering , chromatography , membrane , electrical engineering , physics
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