
Visualizing the double-gyroid twin
Author(s) -
XiQiao Feng,
Mujin Zhuo,
Hua Guo,
Edwin L. Thomas
Publication year - 2021
Publication title -
proceedings of the national academy of sciences of the united states of america
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.011
H-Index - 771
eISSN - 1091-6490
pISSN - 0027-8424
DOI - 10.1073/pnas.2018977118
Subject(s) - gyroid , boundary (topology) , materials science , plane (geometry) , morphology (biology) , surface (topology) , topology (electrical circuits) , crystallography , geometry , chemistry , copolymer , mathematics , combinatorics , polymer , composite material , mathematical analysis , biology , genetics
Significance The characterization of periodic morphologies in soft-matter supramolecular crystals has generally relied on X-ray scattering and transmission electron microscopy techniques. However, understanding the detailed nature of geometrical and topological defects in complex supramolecular assemblies requires high-resolution three-dimensional visualization over large sample volumes. Taking advantage of the recent development of slice-and-view scanning electron microscopy tomography for block copolymers, we clearly identify a sharp, coherent grain boundary in a double-gyroid structured polystyrene-b -polydimethylsiloxane diblock as a (422) twin boundary, likely formed during self-assembly. Knowledge of the geometric and topological nature of defects is important for further improving the performance of supramolecular soft crystals.