Operando characterization of conductive filaments during resistive switching in Mott VO 2
Author(s) -
Shaobo Cheng,
MinHan Lee,
Xing Li,
Lorenzo Fratino,
Federico Tesler,
MyungGeun Han,
Javier del Valle,
R. C. Dynes,
M. J. Rozenberg,
Iván K. Schuller,
Yimei Zhu
Publication year - 2021
Publication title -
proceedings of the national academy of sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.011
H-Index - 771
eISSN - 1091-6490
pISSN - 0027-8424
DOI - 10.1073/pnas.2013676118
Subject(s) - neuromorphic engineering , electrical conductor , resistive touchscreen , materials science , resistive random access memory , non volatile memory , optoelectronics , protein filament , nanotechnology , thermal conduction , computer science , electrical engineering , composite material , voltage , engineering , machine learning , artificial neural network , computer vision
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