Open AccessA quantitative model for the bipolar amplification effect: A new method to determine semiconductor/oxide interface state densities
Author(s) -
James P. Ashton,
Stephen J. Moxim,
Ashton D. Purcell,
Patrick M. Lenahan,
Jason T. Ryan
Publication year - 2021
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0064397
Subject(s) - materials science , semiconductor , sensitivity (control systems) , transistor , semiconductor device , oxide , nanotechnology , optoelectronics , physics , electronic engineering , voltage , layer (electronics) , quantum mechanics , engineering , metallurgy