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High-resolution planar electron beam induced current in bulk diodes using high-energy electrons
Author(s) -
Zoey Warecki,
Andrew A. Allerman,
Andrew M. Armstrong,
A. Alec Talin,
John Cumings
Publication year - 2021
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/5.0051352
Subject(s) - electron beam induced current , electron , materials science , diode , electron beam processing , collimated light , cathode ray , semiconductor , optoelectronics , semiconductor device , schottky diode , radiation damage , optics , atomic physics , silicon , radiation , physics , nanotechnology , laser , layer (electronics) , quantum mechanics

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