Open AccessIon-temperature determination with a baffled Langmuir probe
Author(s) -
S. M. Finnegan,
M. E. Koepke,
V. I. Demidov
Publication year - 2021
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/5.0043602
Subject(s) - shielded cable , langmuir probe , plasma , plasma diagnostics , ion , materials science , magnetic field , tungsten , electron temperature , atomic physics , electron , baffle , optics , ionization , physics , electrical engineering , quantum mechanics , metallurgy , thermodynamics , engineering
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