Open AccessLeakage current characteristics and DC resistance degradation mechanisms in Nb doped PZT films
Author(s) -
Betul AkkopruAkgun,
J. M. Thorsten,
Kosuke Tsuji,
Ke Wang,
Clive A. Randall,
Michael T. Lanagan,
Susan TrolierMcKinstry
Publication year - 2021
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0041927
Subject(s) - materials science , schottky barrier , doping , schottky diode , electric field , cathode , analytical chemistry (journal) , schottky effect , dielectric , fermi level , electron , optoelectronics , chemistry , physics , chromatography , quantum mechanics , diode
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