Open AccessEffect of sample anisotropy on scanning near-field optical microscope images
Author(s) -
S. T. Chui,
Xinzhong Chen,
Ziheng Yao,
Hans A. Bechtel,
Michael C. Martin,
G. L. Carr,
Mengkun Liu
Publication year - 2021
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0039632
Subject(s) - anisotropy , materials science , near field scanning optical microscope , dielectric , isotropy , scattering , optics , sapphire , field (mathematics) , microscopy , optical microscope , light scattering , plasmon , condensed matter physics , optoelectronics , physics , scanning electron microscope , laser , mathematics , pure mathematics
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