Open AccessQuantifying leakage fields at ionic grain boundaries using off-axis electron holography
Author(s) -
Xin Xu,
Frank Barrows,
Vinayak P. Dravid,
Sossina M. Haile,
Charudatta Phatak
Publication year - 2020
Publication title -
journal of applied physics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0031233
Subject(s) - electron holography , leakage (economics) , grain boundary , materials science , electron , semiconductor , ionic bonding , holography , charge density , doping , condensed matter physics , electric field , optoelectronics , optics , nanotechnology , chemistry , ion , physics , transmission electron microscopy , microstructure , composite material , organic chemistry , quantum mechanics , economics , macroeconomics
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