Open AccessQuantitative characterization of dielectric properties of nanoparticles using electrostatic force microscopy
Author(s) -
Marc Descoteaux,
Jacob P. Sunnerberg,
Cristian Staii
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0028132
Subject(s) - dielectric , electrostatic force microscope , materials science , polystyrene , cantilever , polymer , characterization (materials science) , nanoparticle , conductive atomic force microscopy , nanoscopic scale , microscope , microscopy , nanotechnology , phase (matter) , analytical chemistry (journal) , atomic force microscopy , composite material , optics , chemistry , optoelectronics , chromatography , physics , organic chemistry
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