Open AccessCore-level shifts in x-ray photoelectron spectroscopy of arsenic defects in silicon crystal: A first-principles study
Author(s) -
Jun Yamauchi,
Yoshihide Yoshimoto,
Yuji Suwa
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0025316
Subject(s) - binding energy , x ray photoelectron spectroscopy , pseudopotential , silicon , atomic physics , vacancy defect , valence (chemistry) , materials science , chemistry , molecular physics , crystallography , physics , nuclear magnetic resonance , organic chemistry , metallurgy
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