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Dependence on sensitivity patterns of bias fields for vector measurements using optically pumped vapor magnetometers
Author(s) -
J.W. Lou,
Geoffrey A. Cranch
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0024273
Subject(s) - magnetometer , physics , magnetic field , scalar (mathematics) , optics , sensitivity (control systems) , angular resolution (graph drawing) , mathematics , geometry , quantum mechanics , combinatorics , electronic engineering , engineering

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