Development of a high-performance readout circuit for photoelectric detectors
Author(s) -
Honghui Yuan,
Yongping Chen
Publication year - 2020
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0023944
Subject(s) - detector , correlated double sampling , cmos , parasitic capacitance , transistor , noise (video) , capacitance , electrical engineering , linearity , sampling (signal processing) , physics , photoelectric effect , voltage , electronic engineering , optoelectronics , computer science , engineering , amplifier , electrode , quantum mechanics , artificial intelligence , image (mathematics)
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