Open AccessConsistent probe spacing in multi-probe STM experiments
Author(s) -
Jo Onoda,
D. Vick,
Mark Salomons,
Robert A. Wolkow,
Jason Pitters
Publication year - 2020
Publication title -
aip advances
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/5.0021739
Subject(s) - focused ion beam , materials science , scanning tunneling microscope , silicon , nanoscopic scale , radius , microscopy , scanning probe microscopy , field ion microscope , nanotechnology , gallium , ion milling machine , optoelectronics , optics , ion , chemistry , physics , computer security , organic chemistry , layer (electronics) , computer science , metallurgy
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