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Facile and quantitative estimation of strain in nanobubbles with arbitrary symmetry in 2D semiconductors verified using hyperspectral nano-optical imaging
Author(s) -
Thomas Darlington,
Andrey Krayev,
Vishal Venkatesh,
Ravindra Saxena,
Jeffrey W. Kysar,
Nicholas J. Borys,
Deep Jariwala,
P. James Schuck
Publication year - 2020
Publication title -
the journal of chemical physics
Language(s) - English
Resource type - Journals
eISSN - 1089-7690
pISSN - 0021-9606
DOI - 10.1063/5.0012817
Subject(s) - van der waals force , nanomechanics , raman spectroscopy , materials science , semiconductor , symmetry (geometry) , strain (injury) , viscoelasticity , nonlinear system , graphene , condensed matter physics , nanotechnology , optics , physics , atomic force microscopy , optoelectronics , molecule , quantum mechanics , geometry , composite material , mathematics , medicine

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