Open AccessImplementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter
Author(s) -
M. Vescovi,
M. P. Valdivia,
Felipe Veloso,
D. Stutman,
M. Favre
Publication year - 2020
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/5.0001910
Subject(s) - optics , electron density , plasma diagnostics , plasma , physics , pinch , grating , z pinch , pulsed power , beryllium , materials science , radiation , quantum mechanics , nuclear physics , voltage