Raman microprobe determination of local crystal orientation in laser annealed silicon | Zendy

J. B. Hopkins | Zendy; L. A. Farrow | Zendy; G. J. Fisanick | Zendy

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Raman microprobe determination of local crystal orientation in laser annealed silicon

Author(s) -

J. B. Hopkins,

L. A. Farrow,

G. J. Fisanick

Publication year - 1984

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.94829

Subject(s) - microprobe , raman spectroscopy , materials science , silicon , raman scattering , polarization (electrochemistry) , optics , crystal (programming language) , laser , polycrystalline silicon , perpendicular , chemistry , optoelectronics , mineralogy , physics , nanotechnology , geometry , mathematics , computer science , programming language , layer (electronics) , thin film transistor

A Two-Beam Accelerator, in which one of the beams is an intense low energy beam made to undergo free electron lasing and the other beam is a compact bunch of high energy electrons, is shown to be an interesting possibility for a linear collider

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